Extended Data Fig. 2: XMCD-PEEM images taken at low and high temperature.
From: Nanoscale imaging and control of altermagnetism in MnTe
a, XMCD-PEEM image taken at temperature T = 100 K, showing magnetic contrast in open-space region in proximity to a patterned edge. b, The same region re-imaged at T = 250 K, where the XMCD magnetic contrast vanishes, leaving only structural contrast. c, d, Hall resistivity measurements on a 100 μm Hall bar at T = 150 K and 250 K, respectively, showing that the spontaneous anomalous Hall effect is absent at the higher temperature.
