Extended Data Fig. 7: Energy dispersive spectroscopy (EDS) mappings for 176-nm NaLuF4:Tm(15%) nanodiscs.
From: Optical nonlinearities in excess of 500 through sublattice reconstruction
a, Scanning transmission electron microscopy-high-angle annular dark-field images of a single NaLuF4:Tm(15%) nanodisc. b, c, Horizontal (b) and vertical (c) line profiles for Tm and Lu elements.
