Extended Data Fig. 1: Imaging of the NiO single-crystal sample. | Nature

Extended Data Fig. 1: Imaging of the NiO single-crystal sample.

From: Magnon spectroscopy in the electron microscope

Extended Data Fig. 1

a, Annular dark-field image of the edge of a NiO single crystal, acquired with a 2.25 mrad semi-convergence angle (about 1.3 nm probe) along the [100] zone axis. Inset, experimental diffraction pattern along the NiO [100] zone axis at a 2.25 mrad semi-convergence angle, with the monochromating slit inserted, showing the orientation of the EELS collection slot aperture along the (002) row of reflections (dashed yellow box). b, Atomic-resolution high-angle annular dark-field STEM image acquired using a 31 mrad semi-convergence angle from the area marked with a yellow square in panel a.

Back to article page