Extended Data Fig. 8: Simulated position-dependent energy-filtered diffraction patterns of both inelastically and elastically scattered electrons of STO along [001] (upper) and BTO along [010] (lower) at selected energies.
From: Atomic-scale imaging of frequency-dependent phonon anisotropy
49.6 meV (12 THz) and 103.4 meV (25 THz) are selected for STO, while 53.8 meV (13 THz) and 95.1 meV (23 THz) are selected for BTO. The energy bin width is 1 THz. The atomic positions (= O3, O2, Sr or Ba, and Ti/O1) being placed by the electron beam and the energy values are labeled at the top of diffraction patterns. All inelastic signals with certain phonon energy losses (left three columns) are on a linear scale, whereas all elastic signals (right two columns) are on a logarithmic scale. Two dashed green circles indicate EEA positions of DEEA = (−62, 0) and DEEA = (0, −62), respectively. Scale bars are all 20 mrad.
