Extended Data Fig. 2: DC resistivity.
From: Millisecond lifetimes and coherence times in 2D transmon qubits
Resistivity as a function of temperature for Ta-on-Si films at zero applied magnetic field. Error bars represent s.d. arising from instrumental noise. The transition temperature is 4.2 ± 0.1 K, consistent with α-phase Ta. Error in the transition temperature is the step size of the resistivity measurement.
