Extended Data Fig. 5: Electrical configurations of EXIM shields.
From: Electromagnetic interference shielding using metal and MXene thin films
a,b, Schematic illustrations depicting MXene films as capacitive-element-incorporated conductors (CEIC). Equivalent circuit model of MXene films composed of stacked MXene flakes featuring van der Waals (vdW) gaps (a). Surface dipoles on the basal planes of MXene flakes impart capacitive properties to the films, while electron tunneling occur across the vdW gaps (b). c, Electrical configuration of metal–MXene heterostructures represented as a schematic and equivalent circuit consisting of resistive elements (metal films, MXene flakes, tunneling junctions) and capacitive elements (interface and surface dipoles). d, Analytical modeling used to calculate the ideal effective conductivity of EXIM structures. e, Comparison between experimentally measured conductivity values of EXIM shields and theoretical values calculated under ideal and worst-case scenarios. Error bars in e are s.d. from 3–5 samples.
