Fig. 2: Overview of the taxonomy for metric-related pitfalls.
From: Understanding metric-related pitfalls in image analysis validation
Pitfalls can be grouped into three main categories: P1, pitfalls related to the inadequate choice of the problem category; P2, pitfalls related to poor metric selection; and P3, pitfalls related to poor metric application. P2 and P3 are further split into subcategories. For all categories, pitfall sources are presented (turquoise), with references to corresponding illustrations of representative examples. The order in which the pitfall sources are presented does not correlate with importance.
