Fig. 3: Functional circuit heterogeneity of extreme negative GMV deviations in each disorder.
From: Regional, circuit and network heterogeneity of brain abnormalities in psychiatric disorders
a–f, Workflow for characterizing circuit-level heterogeneity. For each participant in the HCtest and each clinical group, we took each brain region showing an extreme deviation (a). For each individual in an independent sample of controls (HC150), we extracted a representative time course from each deviant region and mapped the areas to which it is functionally coupled to using a seed-related FC analysis. Shown here are three participants in a clinical group (Case: P1, P2, P3) and three participants in the control group (HCtest: C1, C2, C3). Two FC maps for two different deviant loci identified in P3, and one FC map for one deviant loci identified in C3 are depicted (b). We thresholded and binarized each FC map associated with a given extreme deviation (c). Note, that no subcortical regions survived this thresholding procedure. We took the union of the thresholded maps across all deviant FC maps to obtain a single map of all areas showing direct FC with one or more deviant areas for a given individual (d). For the HCtest and each clinical group, we quantified the proportion of individuals showing significant FC in a given region, yielding an extreme deviation FC overlap map (e). We subtracted the HCtest FC overlap map from each clinical group’s FC overlap map to obtain an FC \(\Delta\) overlap map for each clinical group. Group differences in circuit-level overlap were evaluated with respect to two empirical null models (for details, see Extended Data Fig. 3) (f). g,h, Cortical surface renderings of regions with significantly greater overlap in cases compared with controls in areas functionally coupled to extreme deviations identified using group-based (g) or spatial permutation tests (h) (pink corresponds to \({P}_{{{\mathrm{uncorrected}}}} < 0.05\), red corresponds to \({P}_{{{\mathrm{FDR}}}} < 0.05\), two tailed, cases > controls). Data used to generate this figure can be found in Supplementary Data 1 (Circuit_neg_parc50).
