Fig. 5
From: On-field optical imaging data for the pre-identification and estimation of leaf deformities
Width and height measurement algorithm of apple leaf layer intensity peaks. (a) 2D cross-sectional image of apple leaf with different layers. (b) 2D cross-sectional image after flattening. (c) Depth profiles of three regions of interest (ROIs) of a single leaf. (d) Average depth profile of three ROIs of a single leaf. (e) Width and height measurement of leaf layer intensity peaks. UE: upper epidermis, PP: palisade parenchyma, SP: spongy parenchyma.
