Figure 3
From: Atom size electron vortex beams with selectable orbital angular momentum
Scanning transmission electron microscopy and spectroscopy performance using single vortex beams on SrTiO3. All STEM images are acquired with electron probes that carry different OAMs (L = −1, L = 0, L = +1, from left to right) as provided by the novel optical setup. Right insets show false-color elemental maps of Ti (red) and Sr (blue) as obtained from EELS at the Ti-L and Sr-M edges. The lower panels show HAADF intensity profiles across the images at positions marked by an arrow. A further inset that is embedded in the HAADF image for the L = +1 eVB (right row) shows the result of an ADF simulation for a sample thickness of 20 nm and a source size broadening of the L = +1 beam of 30 pm. The intensity profile of this simulation is also included as a black line section in the lower panel.
