Figure 8
From: Combined magnetron sputtering and pulsed laser deposition of TiO 2 and BFCO thin films
AFM/PFM measurements of BFCO produced with the MS/PLD technique. (a) Contact topography AFM image (area 2 μm x 2 μm) (b) simultaneously recorded out-of-plane PFM image (b) and (c) in-plane PFM. The z-range is 25 nm for topography; the z-scale for PFM images is in arbitrary units. The scale bar is 400 nm. (d) Piezoresponse hysteresis loop recorded from the area highlighted by the dotted circle.
