Figure 1

Overview of the La-doped ceria nanoparticle sample and the recorded EELS signals. (a) ADF-STEM image of La-doped CeO2 nanoparticle aggregate at the edge of a lacey carbon support. (b) Thickness map of the aggregate determined by EELS analysis, in units of the inelastic mean free path (t/λ). (c) ADF-STEM image acquired simultaneously with EELS, highlighting the locations of the point spectra and selected area spectra shown in (d). (d) Point (red, green) and selected area spectra (blue, inset) at the La and Ce M 45 ionisation edges. These spectra were aligned and corrected for artifacts but were not background subtracted. The arrows (inset) emphasize the plural scattering features in the post-edge spectral window. Scale bars are 25 nm.