Figure 2 | Scientific Reports

Figure 2

From: Interface Adhesion and Structural Characterization of Rolled-up GaAs/In0.2Ga0.8As Multilayer Tubes by Coherent Phonon Spectroscopy

Figure 2

(a) Time-resolved reflectivity change of both planar samples A (blue) and B (purple). (b) FFT spectrum of the planar MBE grown bilayer (unrolled sample A as in the left part of Fig. 1). The inset shows the extracted time-resolved reflectivity change. (c) FFT spectrum of the planar MBE grown layers with an additional layer of Al2O3 (unrolled sample B as in the right part of Fig. 1). The inset shows the extracted time-resolved reflectivity change.

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