Figure 1
Structure of the nanowires. (a) SEM image of nanowires on Ge substrate, shows majority of the wires were vertically grown on the substrate. (b) SEM image of nanowires after transferred to carbon tape, shows wire were aligned on the tape. (c) X-ray diffraction pattern measured from the nanowires on Ge wafer, matches FeGe2 as indexed in the figure. Red arrows mark the Ge (004) peak of the substrate and impurity peaks identified as GeO2 (100) and (201). (d) and (e) TEM images from single nanowire. (e) is the zoom in of the red rectangle area in (d). (f) The electron diffraction pattern of (e), it identified that the structure matches space group I4/mcm and long axis direction of nanowires is along [110].
