Figure 5
From: Next Generation Ceramic Substrate Fabricated at Room Temperature

XRD patterns of (a) AlN powders and (b) AlN AD/GSV films. The peaks for Al2O3 are observed when they are heat-treated at 850 °C.
From: Next Generation Ceramic Substrate Fabricated at Room Temperature

XRD patterns of (a) AlN powders and (b) AlN AD/GSV films. The peaks for Al2O3 are observed when they are heat-treated at 850 °C.