Figure 1 | Scientific Reports

Figure 1

From: Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

Figure 1

The basic concept of GESIMS analysis. Graphene blocks the emission of the matter from the substrate but significantly increases the ionization probability. By creating some defects in graphene layer the emission increases while the ionization ability is preserved and thus more ions can reach the detector, resulting in enhanced SIMS signal.

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