Figure 7
From: Confinement suppresses instabilities in particle-laden droplets
Particle arrangement and defects. SEM micrographs and histograms indicating the void fractions (φ) for (a) unconfined (b) confined droplet. Here each particle (N) is considered as a bin and void fraction is calculated for each bin. Nt is the total number of particles. Scale bar equals 400 nm. 200 nm particles are used to study the effect of confinement on particle arrangement.
