Figure 2 | Scientific Reports

Figure 2

From: Combining ε-Near-Zero Behavior and Stopped Light Energy Bands for Ultra-Low Reflection and Reduced Dispersion of Slow Light

Figure 2

(a) Reflectivity profile as a function of incident angle (within SiO2) and input frequency. The dispersion of a bulk plasmon polariton mode (FB, white solid line) overlapping dip in reflectivity is predicted to occur due to ENZ behavior circa a frequency of 1.565 rad/fs (gray horizontal line, red online). Expected plasmon resonances for ITO thin films appear in the upper left of the profile andresonance excitation of a pseudo-Brewster (PB, black curve) mode is also superimposed. (b) The absorbance for the structure with values reaching over 98% within the innermost contour. The FB mode covers frequencies corresponding to a wavelength range of roughly 1207–1219 nm. Points of perfect antireflection (PAR) points and a point of zero GVD (black star) are highlighted.

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