Figure 4
From: Defect generation in Pd layers by ‘smart’ films with high H-affinity
HRTEM images on the Pd12nm/Nb15nm/Al2O3. (a) Before the hydrogen exposure (b) during hydrogen exposure to p H2 = 1 mbar. Stacking faults presented in the area of interest before the hydrogen loading (marked with yellow arrows), disappear during the hydrogen loading with p H2 ≤ 1 mbar.
