Figure 2
From: Role of 2D and 3D defects on the reduction of LaNiO3 nanoparticles for catalysis
Bright-field STEM images of cp-LNO imaged in an environmental cell containing H2 gas at 250mbar at elevated temperature at (a,b) 250 °C; (b) high magnification of stacking fault showing ½ cell displacement characteristic of the RP-fault and overlay of Ni and La atomic positions, (c) 350 °C; and (d) 450 °C. Arrows in (c) and (d) indicate the locations of growing Ni crystals. (e) Bright field image of ht-LNO at 250 °C and EELS mapping of Ni (green) and La (red) in the ht-LNO sample at (f) 350 °C, (g) 450 °C, (h) 600 °C, and (i) 700 °C.
