Figure 1
From: Scatter-plate microscope for lensless microscopy with diffraction limited resolution
Microscope imaging systems: (a) PSF of a conventional microscope objective (b) conventional microscope imaging (c) PSF of a scattering layer, which in this case is a speckle pattern \(S({\boldsymbol{r}},\hat{{\boldsymbol{r}}},z,\hat{z})\), (d) microscope imaging using a thin scattering layer (‘scatter-plate microscope’). The object is placed close to the scattering layer at \(\hat{z}\), and the aperture size is increased to achieve a high numerical aperture. The image plane is far at a distance \(z\) from the scattering layer, to have a larger magnification. The images are produced from the cross-correlation of the object intensity distribution \({I}_{ob}({\boldsymbol{r}},z)\) (in the image plane) and the PSF \(S({\boldsymbol{r}},\hat{{\boldsymbol{r}}},z,\hat{z})\). (e) Conventional microscope image of numeral 6, (f) a part of the PSF of the scattering layer (speckle pattern), (g) a part of the recorded object intensity distribution and (h) the image reconstruction via intensity cross-correlation. The scale bar is 3 µm in object space.
