Figure 6

(a) Integrated CL intensity image of the shorter wavelength emission (285–300 nm) and (b) Electron channelling contrast image on the same scale but a different area of the same semi-polar Al x Ga1−x N sample with x = 0.40. The dashed lines indicate regions with and without BSFs. (c) Higher resolution ECC image of the area marked in (b) showing either individual TDs or partial dislocation terminating at the end of a BSF.