Figure 7
STEM-EDX mapping of a LAS glass sample thermally treated at 725 °C for t = 24 h. The comparison of the images (a,b) shows the radiation damage of the sample especially in the matrix area after the STEM-EDX investigations (highlighted by the blue dotted frame). The white frame in (a) shows the EDX-mapping area which is pointed out separately in (c). The images (d–f) show the enrichment of the elements Al, Si, and Zr. An overlay representation of the lateral distribution of Al and Zr is shown in (g).
