Figure 3
(a) HR-TEM image of sample annealed for 8 hours (left) and collected SAED pattern, scale is 2 × nm−1 (right), SAED pattern is divided in two sections, as collected (left side) and processed pattern (right side). This was done in order to allow easy identification of the polycrystalline pattern64. (b) Cross-section Dark field (DF) image of the sample, clearly showing the presence of both reconstructed and unreconstructed areas in the sample (left). Lamella for HR-TEM observation was collected from the dashed region in the AFM image (right) (c) Extracted values of EDX compositional mapping for Gd and Mo (normalized to O at.%) in the region shown in DF image (covering reconstructed –left and as deposited –right areas), both with similar scale (500 nm).
