Figure 1

(a) High-angle θ-2θ x-ray diffraction pattern of V₂O₃ (100 nm)/Ni (10 nm) sample, misaligned by 0.1° to suppress the substrate peaks. The V₂O₃ (012), (024), and (036) peaks are identified by *, the Ni (111) identified by ^†, and sapphire (012) and (024) identified by ^‡. (b) Reciprocal space map of V₂O₃ recorded along the long edge of the substrate. The (012) plane is parallel to the surface at Q _||  = 0, while the (104) points 48° to the surface normal. (c) Pole figure of the (104) plane showing the epitaxy of V₂O₃. The (\(01\mathop{4}\limits^{\bar{} }\)) lies at 82° with respect to the surface normal. (d) Schematic reconstruction of the real space orientation of the V₂O₃ crystal planes following from symmetry considerations of the measured planes.