Figure 2
From: A micro-Raman study of exfoliated few-layered n-type Bi2 Te2.7Se0.3
Representative TEM (a) and AFM (b) images of the exf8h sample. (c) The average thickness of the exfoliated n-type Bi2Te2.7Se0.3 flakes as a function of exfoliation times (0 h, 3 h, 5 h, and 8 h). The full width of half maximum of thickness distribution (Gaussian distribution) were used as error bars. t tends to be infinite at 0 h and the dash line is a guide to the eye. (d) The lateral size and height of a representative flake shown in (b).
