Figure 5

(a–e) Typical cyclic voltammetric response of the pErGO-based solid-state device at different scan rates starting from 0.01 V s−1 to 100 V s−1. (f) The dependence of specific capacitance on scan rate is shown with a semi log plot.

(a–e) Typical cyclic voltammetric response of the pErGO-based solid-state device at different scan rates starting from 0.01 V s−1 to 100 V s−1. (f) The dependence of specific capacitance on scan rate is shown with a semi log plot.