Figure 2

XRD characterisation of the Cd₃As₂ films annealed at high temperatures. XRD θ-2θ scans and corresponding rocking curves of the (224) Cd₃As₂ film peaks (a) before annealing and (b,c) after annealing at 500 °C, (d,e) 550 °C, and (f,g) 600 °C. (h) Sample structure and changes of the crystalline nature in each layer due to the annealing. (i–k) In-plane reciprocal space mappings and (l)–(n) ϕ-scans along the red curves in the reciprocal space mappings. The ϕ-scan pattern shown in (n) represents two sets of 6-fold peaks. Major and minor in-plane stacking patterns of the As triangular lattice are denoted by dark and light green hexagons as shown in the right panel of Fig. 1(a).