Figure 3

(a) Cross-sectional bright field TEM image of the Mn2GaC film on MgO(111) substrate; (b) HAADF/STEM atomic resolution image of the structure. The bright (grey) points correspond to Ga (Mn) atomic columns; (c) [0001] and (d) \([01\bar{1}0]\) zone axis selected area electron diffraction patterns recorded in plane-view and cross-section of the sample; (e) Atomic plane resolved distribution of Ga and Mn in the Mn2GaC obtained by the line-scan analysis using STEM/EDX along the yellow arrow as shown in the corresponding HAADF/STEM image.