Figure 1
From: Tunable critical temperature for superconductivity in FeSe thin films by pulsed laser deposition
X-ray diffraction data of FeSe thin films. (a,b) The XRD θ-2θ scan data for FeSe thin films on various substrates. The triangles mark the Bragg diffraction peaks. The order is CaF2 (CF) SrTiO3 (STO), LiF (LF), MgO (MO), BaF2 (BF), TiO2 (100) (TO), LaAlO3 (LAO), MgF2 (MF), Nb-doped SrTiO3 (NSTO), La0.3Sr0.7Al0.65Ta0.35O3 (LSAT), (Sr,La)AlO4 (SLAO), and MgAl2O4 (MAO). (c) The enlarged view of the FeSe(002) peaks. These peaks exhibit obvious shift for different substrates. Here, the dash line is related to the (002) peak of FeSe/MAO. (d) The XRD rocking curve data of FeSe/CaF2. (e) The XRD φ-scan data of FeSe/CaF2. A four-fold symmetry of FeSe(011) diffraction peak indicates a high-quality epitaxial growth.
