Figure 2
From: Large anisotropy of ferroelectric and pyroelectric properties in heteroepitaxial oxide layers

(a,c) XRD θ/2θ scans of PZT deposited on (a) SRO/STO/Si(001) and (b) STO/Si(001). Dash lines show the {002} bulk Bragg reflections of a-oriented and c-oriented PZT ferroelectric domains. (b,d) XRD ω-scans around the {002} Bragg reflections of PZT on (b) SRO/STO/Si(001) and (d) STO/Si(001).