Figure 3

(a–d) The plot of DEP, EP, EOF and the net force applied on the 510 nm COOH-PS beads along the length of the 1 μm pipette under different ionic strengths. A positive 10 V/cm bias was applied at the base of the pipette. The zoom in figures show the distribution of EK forces within a close distance from the pipette’s tip at the trapping zone.