Figure 2
From: Precisely controlled fabrication, manipulation and in-situ analysis of Cu based nanoparticles

(a) Nanoparticle rate vs. power (ϕT = 100 sccm, ϕAr = 50 sccm); (b) Evolution of the NP rate as a function of the ϕAr injected through the magnetron in use for a ϕT of 100 sccm (P = 30 W). Inset: AFM image (1 µm2) of the sample fabricated with ϕAr = 10 sccm. (c) NP rate vs. power for different ϕT in the magnetron in use (ϕAr = 10 sccm). The error bars indicate a 10% error of the QCM measurement.