Figure 3
From: Precisely controlled fabrication, manipulation and in-situ analysis of Cu based nanoparticles
Comparison of the experimental Ar (λ = 696.5 nm) and Cu (λ = 578.2 nm) line intensities (a,d), the ratio between both intensities ICu/IAr (b,e) and the Ar and Cu excitation temperatures (c,f), depicted as a function of the magnetron power at a fix distance (dOES = 58 mm) (a–c), and as a function of the magnetron distance, dOES, at a constant power (P = 30 W) (d–f). Lines serve as guides.
