Figure 3

TEM analysis of 820–5 M alloy. (a) BF-TEM micrograph taken from the interface between the nanometer-grained region and micrometre-grained region. (b) BF-TEM micrograph taken from the nanometer-grained duplex region. (c) SAED pattern taken from the grain exhibiting darkest contrast in (b). (d) High magnification BF-TEM micrograph and its corresponding DF-TEM micrograph (e) taken from the bottom-right dark grain in (a). (f) SAED pattern on [113]β zone axis.