Figure 1

(aāc) XRD patterns, Raman and UV-Vis spectra and (dāf) top-view SEM images of CXTS films prepared by H2O/ethanol precursor solutions. The films of XRD and Raman measurements were prepared on quartz.

(aāc) XRD patterns, Raman and UV-Vis spectra and (dāf) top-view SEM images of CXTS films prepared by H2O/ethanol precursor solutions. The films of XRD and Raman measurements were prepared on quartz.