Figure 13
From: Growing Oriented Layers of Bi4Ti3O12 in Bi2O3/TiO2/SiO2/Nd2O3/Al2O3 Glass-Ceramics by Melt Quenching
SEM-micrograph featuring the bottom interface of glass-ceramic D as well as the area where the growth fronts from the opposing interfaces of the sample collided. It is superimposed by the IPF + IQ-map of an EBSD-scan performed on the area and the 100 PFs of the respectively highlighted domains of growth are presented.
