Figure 7
From: Growing Oriented Layers of Bi4Ti3O12 in Bi2O3/TiO2/SiO2/Nd2O3/Al2O3 Glass-Ceramics by Melt Quenching
(a) SEM-micrograph showing the fine crystallisation at the bottom edge of glass-ceramic B. (b) IPF + IQ-map of an EBSD-scan performed in frame f1. (c) Phase map of the EBSD-scan in frame f2 and element maps of Al, Si, Ti and Si in the area of frame f3.
