Figure 8
From: Growing Oriented Layers of Bi4Ti3O12 in Bi2O3/TiO2/SiO2/Nd2O3/Al2O3 Glass-Ceramics by Melt Quenching
(a) SEM-micrograph of the entire cross section of glass-ceramic C. An EBSD-scan was performed in the framed area. (b) IPF + IQ-map of the EBSD-scan as well as 100, 010 and 001 PFs illustrating the orientation of the respective crystallographic axes of Bi4Ti3O12 in the highlighted sections near the edge and in the bulk.
