Figure 9
From: Growing Oriented Layers of Bi4Ti3O12 in Bi2O3/TiO2/SiO2/Nd2O3/Al2O3 Glass-Ceramics by Melt Quenching
(a) SEM-micrograph of the immediate bottom edge of glass-ceramic C superimposed by the IPF + IQ-map of an EBSD-scan performed on the area. The 100, 010, and 001 PFs of the data points below the white line are also presented. (b) An SEM-micrograph of the framed area.
