Figure 5

Measured J_c as a function of external field for samples (a) 10% (SiC), 10% (B₄C) (b) and x% (B₄C) from x = 0 to x = 100 and (c) J_c as a function of external fields at 5 K for MPIG samples. (d) Pinning force (J_cxB) at 20 K, as a function of reduced field (µ₀H/µ₀H_irr) for undoped and doped MgB₂ samples processed by IG.