Figure 5
From: Origin of relationship between ferromagnetic response and damage in stretched systems
(a,b) Ni80Fe20 and CoFeB 20 nm-films resonance spectra for two different voltages applied to the piezoelctronic actuators (0 V and 100 V). (c) Variation of the in-plane strains (εxx and εyy) measured at the top surface of the films as a function of the applied voltage d) Resonance field shift (δHres = Hres(100 V) − Hres(0)) variations as function of the applied voltage. Solid lines refer to the adjusting models for the two samples, using Eq. 2 with the parameters indicated in the text.
