Figure 4
(a) Normalized dispersion relations, by the anisotropy field (HF = 4πMs) and zero-field resonance frequency (γHF) of a continuous thin Ni film, for Ni CNT networks with ϕ = 230 nm fabricated at reduction potentials in the range from −0.8 V to −1.1 V. (b) Variation of Heff as a function of the reduction potential (lozenges) for Ni CNT networks along with the value for a Ni CNW network (dash-dotted line). Error bars are estimated from the standard deviation of the experimental fN vs hr dispersion relations.
