Figure 3
From: Facile reduction of graphene oxide suspensions and films using glass wafers
(a) XRD patterns of the initial GO and rGO samples. The d-value is given in Å. The (10.l) and (11.l) indicate diffraction reflections corresponding to the superposition of crystalline reflections of type (hk.l) and two-dimensional lattice reflections of type (hk). The reflection peaks of metal-containing contaminants are marked using the following PDF data: *-Na2Mg(CO3)2 (PDF No.00-024-1227); #-BaCO3 (PDF No.00-002-0364); х-MgO (PDF No.01-077-2906), o-Na2SiO3 (PDF No. 00-016-0818). (b) Raman spectra of the GO and rGO samples recorded using a 532-nm laser. TEM images and selected area diffraction (SAED) patterns (in the insets) of the (c) initial GO, (d) rGO_S-gl, (e) rGO_AB-gl and (f) rGO_Mg-gl samples. White circles denote nanoscale holes formed during reduction.
