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Figure 1

From: Xenon solubility and formation of supercritical xenon precipitates in glasses under non-equilibrium conditions

Figure 1

BF-TEM images and analysis of a-SiO2 implanted with 40 keV Xe ions at 295 K: (a,b) over and under-focus images, respectively, after implantation with 1016 ions.cm−2. The arrows indicate a precipitate and a void in (a,b) respectively (c,d) over and under-focus images, respectively, after implantation with 4 × 1016 ions.cm−2 (defocus = 2 µm for all the images (see Fig. S2.1 in the SI for the effect of image defocus on the precipitate visibility); and (e) areal (left-hand axis) and volumetric (right-hand axis) densities of the precipitates as functions of fluence. The insets (I) and (II) show the PD and total areal density of the precipitates as functions of fluence. Images of the pristine specimen are shown in Fig. S2.3 in the SI.

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