Figure 3
Simulation of a general at-focus TEM image showing the effect of Xe density on the contrast and transmitted electron intensity. (a) Simulation of 10 nm diameter Xe precipitates in a-SiO2 with densities ranging from 5.5 g.cm−3 (left) to 0 g.cm−3 (right); (b) normalized transmitted electron intensity profiles obtained by simulating a line scan using 105 electrons per spot (see Methods); and (c) Weber contrast as a function of Xe density. The red line in (c) is a linear fit to the data and the horizontal black line is drawn at zero contrast observed when Xe density is about 1 g.cm−3.
