Figure 2
From: Silicon germanium photo-blocking layers for a-IGZO based industrial display
Material characterization of the Si-Ge photo blocking layers. (a) XRD patterns of the Si-Ge films. (b) Raman spectra of the Si-Ge photo blocking layers compared with a bulk Si. XPS spectra of the Si-Ge films showing signals of (c) Si 2p and (d) Ge 3d.
