Figure 3 | Scientific Reports

Figure 3

From: Enhancement in surface mobility and quantum transport of Bi2−xSbxTe3−ySey topological insulator by controlling the crystal growth conditions

Figure 3

Powder XRD patterns of the BSTS samples grown by MG, BG and MBG methods (a). The extended view of the powder XRD patterns near the (108) peak to compare their characteristic diffraction peaks (b). The \({I}_{(00\overline{{\rm{12}}})}/{I}_{(018)}\) and \({I}_{(107)}/{I}_{(018)}\) of BSTS crystal grown by different methods (c). The solid dots and error bars in (c) present the mean values and standard deviation of the means calculated from three representative powder XRD patterns for each sample.

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