Figure 1
From: Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories
(a) Schematic of the TaN/TiTe/Al2O3/Ta device structure of the HAXPES measurements and schematic of the setup for electrical characterization (b) I-V curve for the forming and the reset of the TaN/TiTe/Al2O3/Ta stack.
