Figure 1 | Scientific Reports

Figure 1

From: Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction

Figure 1

High energy in-situ XRD setup at (a) MS beamline (26 keV), SLS, Switzerland (b) DiffAbs (19 keV), SOLEIL, France. The setup includes (1) incident X-ray beam, (2) diffracted X-ray beam, (3) 1D XRD detector, (4) 2D XRD detector (a: PILATUS 6 M, b: XPAD S140), (5) Micro Tensile Machine (MTM), (6) fixed grip of MTM, (7) moving grip of MTM, (8) Ni microwire mounted on specific holder.

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